Ergebnisse für: process variability

Hier findest Du Bücher, die sich mit process variability beschäftigen.

Buch Cover Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs
Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs
Alexandra Zimpeck, Cristina Meinhardt, Laurent Artola, Ricardo Reis
Springer International Publishing
106.99 € · Hardcover
hardware reliability soft error analysis circuit-level soft error mitigation Fault-Tolerant Design FinFET soft errors
This book evaluates the influence of process variations (e.g. work-function fluctuations) and radiation-induced soft errors in a set of logic cells using FinFET technology, considering the 7nm technological node as a case study. Moreover, for accurate soft error estimation, the authors adopt a radia...
Buch Cover Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs
Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs
Alexandra Zimpeck, Cristina Meinhardt, Laurent Artola, Ricardo Reis
Springer International Publishing
74.89 € · eBook
hardware reliability soft error analysis circuit-level soft error mitigation Fault-Tolerant Design FinFET soft errors
This book evaluates the influence of process variations (e.g. work-function fluctuations) and radiation-induced soft errors in a set of logic cells using FinFET technology, considering the 7nm technological node as a case study. Moreover, for accurate soft error estimation, the authors adopt a radia...
Buch Cover Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs
Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs
Alexandra Zimpeck, Cristina Meinhardt, Laurent Artola, Ricardo Reis
Springer International Publishing
74.89 € · Paperback
hardware reliability soft error analysis circuit-level soft error mitigation Fault-Tolerant Design FinFET soft errors
This book evaluates the influence of process variations (e.g. work-function fluctuations) and radiation-induced soft errors in a set of logic cells using FinFET technology, considering the 7nm technological node as a case study. Moreover, for accurate soft error estimation, the authors adopt a radia...
Buch Cover Stochastic Process Variation in Deep-Submicron CMOS
Stochastic Process Variation in Deep-Submicron CMOS
Amir Zjajo
Springer Netherland
128.39 € · Hardcover
Deep-submicron CMOS Dynamic Thermal Methodology Electrothermal Couplings High Performance MPSoC Low Voltage Die-Level Process Variation Modified Runge-Kutta Solver Power Management Process Variability Analysis Reliable Mixed-Signal Circuit Design Statistical Transistor Model electrical noise process variation stochastic analysis
One of the most notable features of nanometer scale CMOS technology is the increasing magnitude of variability of the key device parameters affecting performance of integrated circuits. The growth of variability can be attributed to multiple factors, including the difficulty of manufacturing control...
Buch Cover Timing Performance of Nanometer Digital Circuits Under Process Variations
Timing Performance of Nanometer Digital Circuits Under Process Variations
Victor Champac, Jose Garcia Gervacio
Springer International Publishing
128.39 € · Hardcover
Process Variations and Probabilistic Integrated Circuit Design Variation-Aware Design of Custom Integrated Circuits Statistical Performance Modeling and Optimization Yield and Variability Optimization of Integrated Circuits Statistical Analysis and Optimization for VLSI
This book discusses the digital design of integrated circuits under process variations, with a focus on design-time solutions. The authors describe a step-by-step methodology, going from logic gates to logic paths to the circuit level. Topics are presented in comprehensively, without overwhelming us...
Buch Cover Industrial Design of Experiments
Industrial Design of Experiments
Sammy Shina
Springer International Publishing
80.24 € · Hardcover
Analysis of Experiments DoE Quality Optimization Taguchi Method Saturated design Factorial design Multiple factor and level design Statistical analysis Variability reduction Multiple regression Design of Experiments Variability analysis
This textbook provides the tools, techniques, and industry examples needed for the successful implementation of design of experiments (DoE) in engineering and manufacturing applications. It contains a high-level engineering analysis of key issues in the design, development, and successful analy...
Buch Cover Scientific Injection Molding Tools
Scientific Injection Molding Tools
José R. Lerma Valero
Hanser Publications
119.99 € · Hardcover
design of experiments gate seal injection mold manufacturing mechanical properties melt mold filling molding machine plastics polymers process variability process window thermoplastics viscosity
This book provides a user-friendly guide to the implementation of Scientific Injection Molding, a proven methodology to ensure robust and reliable mass production of plastic parts. Readers will gain a clear understanding of their machines and especially their condition and behavior through on-site ...
Buch Cover From manufacturing variability to process-aware circuit simulation
From manufacturing variability to process-aware circuit simulation
Luca Sponton
Hartung-Gorre
64 € · Buch
Design For Manufacturing, TCAD, Semiconductor devices, Process Simulation, 3D simulation, LER
...
Buch Cover CMOS RF Circuit Design for Reliability and Variability
CMOS RF Circuit Design for Reliability and Variability
Jiann-Shiun Yuan
Springer Singapore
53.49 € · Paperback
Device Reliaiblity Hot Electron Effect Oxide Breakdown Process Variation RF Circuit Reliability
The subject of this book is CMOS RF circuit design for reliability. The device reliability and process variation issues on RF transmitter and receiver circuits will be particular interest to the readers in the field of semiconductor devices and circuits. This proposed book is unique to explore typic...
Buch Cover CMOS RF Circuit Design for Reliability and Variability
CMOS RF Circuit Design for Reliability and Variability
Jiann-Shiun Yuan
Springer Singapore
53.49 € · eBook
Device Reliaiblity Hot Electron Effect Oxide Breakdown Process Variation RF Circuit Reliability
The subject of this book is CMOS RF circuit design for reliability. The device reliability and process variation issues on RF transmitter and receiver circuits will be particular interest to the readers in the field of semiconductor devices and circuits. This proposed book is unique to explore typic...
Buch Cover Enterprise, Business-Process and Information Systems Modeling
Enterprise, Business-Process and Information Systems Modeling

Springer International Publishing
53.49 € · Paperback
BPM Business Process Management Enterprise Architecture Enterprise Modeling MDA Model-Driven Architecture Modeling Languages Process Mining Requirements Engineering Process Variability
This book contains the refereed proceedings of the 17th International Conference on Business Process Modeling, Development and Support, BPMDS 2016, and the 21st International Conference on Exploring Modeling Methods for Systems Analysis and Design, EMMSAD 2016, held together with the 28th Internatio...