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Stochastic Process Variation in Deep-Submicron CMOS

Amir Zjajo
Springer Netherland
128.39 € · Hardcover

Deep-submicron CMOS Dynamic Thermal Methodology Electrothermal Couplings High Performance MPSoC Low Voltage Die-Level Process Variation Modified Runge-Kutta Solver Power Management Process Variability Analysis Reliable Mixed-Signal Circuit Design Statistical Transistor Model electrical noise process variation stochastic analysis

One of the most notable features of nanometer scale CMOS technology is the increasing magnitude of variability of the key device parameters affecting performance of integrated circuits. The growth of variability can be attributed to multiple factors, including the difficulty of manufacturing control...

Stochastic Process Variation in Deep-Submicron CMOS

Amir Zjajo
Springer Netherland
99.98 € · Paperback

Deep-submicron CMOS Dynamic Thermal Methodology Electrothermal Couplings High Performance MPSoC Low Voltage Die-Level Process Variation Modified Runge-Kutta Solver Power Management Process Variability Analysis Reliable Mixed-Signal Circuit Design Statistical Transistor Model electrical noise process variation stochastic analysis

One of the most notable features of nanometer scale CMOS technology is the increasing magnitude of variability of the key device parameters affecting performance of integrated circuits. The growth of variability can be attributed to multiple factors, including the difficulty of manufacturing control...

Stochastic Process Variation in Deep-Submicron CMOS

Amir Zjajo
Springer Netherland
96.29 € · eBook

Deep-submicron CMOS Dynamic Thermal Methodology Electrothermal Couplings High Performance MPSoC Low Voltage Die-Level Process Variation Modified Runge-Kutta Solver Power Management Process Variability Analysis Reliable Mixed-Signal Circuit Design Statistical Transistor Model electrical noise process variation stochastic analysis

One of the most notable features of nanometer scale CMOS technology is the increasing magnitude of variability of the key device parameters affecting performance of integrated circuits. The growth of variability can be attributed to multiple factors, including the difficulty of manufacturing control...

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