Ergebnisse für: Large-scale test

Hier findest Du Bücher, die sich mit Large-scale test beschäftigen.

Buch Cover Innovative Digital-Based International Large-Scale Assessments

Springer International Publishing
139.09 € · Hardcover
...
Buch Cover Large-Scale Brain Systems and Neuropsychological Testing

Springer International Publishing
85.59 € · Hardcover
...
Buch Cover Built-in Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design

Springer Singapore
213.99 € · Hardcover
...
Buch Cover VLSI Design and Test for Systems Dependability

Springer Tokyo
246.09 € · Hardcover
...
Buch Cover Test Generation of Crosstalk Delay Faults in VLSI Circuits

Springer Singapore
149.79 € · Hardcover
...
Buch Cover Micro-Electrode-Dot-Array Digital Microfluidic Biochips

Springer International Publishing
106.99 € · Hardcover
...
Buch Cover Testing of Materials for Fire Protection Needs

Springer International Publishing
160.49 € · Hardcover
...
Buch Cover Innovative Digital-Based International Large-Scale Assessments

Springer International Publishing
128.39 € · eBook
...
Buch Cover Large-Scale Brain Systems and Neuropsychological Testing

Springer International Publishing
60.98 € · Paperback
...
Buch Cover Large-Scale Brain Systems and Neuropsychological Testing

Springer International Publishing
60.98 € · eBook
...
Buch Cover Agile Methods. Large-Scale Development, Refactoring, Testing, and Estimation

Springer International Publishing
50.28 € · eBook
...
Buch Cover Agile Methods. Large-Scale Development, Refactoring, Testing, and Estimation

Springer International Publishing
51.36 € · Paperback
...
Buch Cover Built-in Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design

Springer Singapore
213.99 € · Paperback
...
Buch Cover Built-in Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design

Springer Singapore
213.99 € · eBook
...
Buch Cover VLSI Design and Test for Systems Dependability

Springer Tokyo
234.33 € · eBook
...
Buch Cover VLSI Design and Test for Systems Dependability

Springer Tokyo
246.09 € · Paperback
...
Buch Cover Test Generation of Crosstalk Delay Faults in VLSI Circuits

Springer Singapore
149.79 € · Paperback
...
Buch Cover Test Generation of Crosstalk Delay Faults in VLSI Circuits

Springer Singapore
139.09 € · eBook
...
Buch Cover Micro-Electrode-Dot-Array Digital Microfluidic Biochips

Springer International Publishing
96.29 € · eBook
...
Buch Cover Testing of Materials for Fire Protection Needs

Springer International Publishing
160.49 € · eBook
...

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