Test Generation of Crosstalk Delay Faults in VLSI Circuits

Beschreibung

This book describes a variety of test generation algorithms for testing crosstalk delay faults in VLSI circuits. It introduces readers to the various crosstalk effects and describes both deterministic and simulation-based methods for testing crosstalk delay faults. The book begins with a focus on currently available crosstalk delay models, test generation algorithms for delay faults and crosstalk delay faults, before moving on to deterministic algorithms and simulation-based algorithms used to test crosstalk delay faults. Given its depth of coverage, the book will be of interest to design engineers and researchers in the field of VLSI Testing.
This book describes a variety of test generation algorithms for testing crosstalk delay faults in VLSI circuits. It introduces readers to the various crosstalk effects and describes both deterministic and simulation-based methods for testing crosstalk delay faults. The book begins with a focus on currently available crosstalk delay models, test generation algorithms for delay faults and crosstalk delay faults, before moving on to deterministic algorithms and simulation-based algorithms used to test crosstalk delay faults. Given its depth of coverage, the book will be of interest to design engineers and researchers in the field of VLSI Testing.
Is intended for design engineers and researchers in the field of VLSI and embedded system design Introduces readers to deterministic and simulation-based algorithms for testing crosstalk delay faults in VLSI circuits Provides a review of various test generation algorithms for crosstalk delay faults

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S. Jayanthy

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Crosstalk delay faults Very Large Scale Integration Deterministic Algorithms Genetic Algorithm Fuzzy Delay Model

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