VLSI Design and Test for Systems Dependability
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Beschreibung
This book discusses the new roles that the VLSI (very-large-scale integration of semiconductor circuits) is taking for the safe, secure, and dependable design and operation of electronic systems.
The book consists of three parts. Part I, as a general introduction to this vital topic, describes how electronic systems are designed and tested with particular emphasis on dependability engineering, where the simultaneous assessment of the detrimental outcome of failures and cost of their containment is made. This section also describes the related research project “Dependable VLSI Systems,” in which the editor and authors of the book were involved for 8 years. Part II addresses various threats to the dependability of VLSIs as key systems components, including time-dependent degradations, variations in device characteristics, ionizing radiation, electromagnetic interference, design errors, and tampering, with discussion of technologies to counter those threats. Part III elaborates on the design and test technologies for dependability in such applications as control of robots and vehicles, data processing, and storage in a cloud environment and heterogeneous wireless telecommunications.
This book is intended to be used as a reference for engineers who work on the design and testing of VLSI systems with particular attention to dependability. It can be used as a textbook in graduate courses as well. Readers interested in dependable systems from social and industrial–economic perspectives will also benefit from the discussions in this book.
This book discusses the new roles that the VLSI (very-large-scale integration of semiconductor circuits) is taking for the safe, secure, and dependable design and operation of electronic systems.
The book consists of three parts. Part I, as a general introduction to this vital topic, describes how electronic systems are designed and tested with particular emphasis on dependability engineering, where the simultaneous assessment of the detrimental outcome of failures and cost of their containment is made. This section also describes the related research project “Dependable VLSI Systems,” in which the editor and authors of the book were involved for 8 years. Part II addresses various threats to the dependability of VLSIs as key systems components, including time-dependent degradations, variations in device characteristics, ionizing radiation, electromagnetic interference, design errors, and tampering, with discussion of technologies to counter those threats. Part III elaborates on the design and test technologies for dependability in such applications as control of robots and vehicles, data processing, and storage in a cloud environment and heterogeneous wireless telecommunications.
This book is intended to be used as a reference for engineers who work on the design and testing of VLSI systems with particular attention to dependability. It can be used as a textbook in graduate courses as well. Readers interested in dependable systems from social and industrial–economic perspectives will also benefit from the discussions in this book.
Is the first book to focus on the new roles VLSI is taking for the safe, secure, and dependable design and operation of electronic systems Contributes to a better understanding of threats against safe and secure systems and how to mitigate them by advanced design and testing of VLSI as core components Describes specific applications of design and testing for dependability in real-world applications such as controls for robots and vehicles, wireless communications, system of systems, and the Internet of Things (IoT)
Is the first book to focus on the new roles VLSI is taking for the safe, secure, and dependable design and operation of electronic systems
Contributes to a better understanding of threats against safe and secure systems and how to mitigate them by advanced design and testing of VLSI as core components
Describes specific applications of design and testing for dependability in real-world applications such as controls for robots and vehicles, wireless communications, system of systems, and the Internet of Things (IoT)
Autor*in
Shojiro Asai
Themen in »VLSI Design and Test for Systems Dependability«
CREST Program Error Correction Fault Tolerant Safety and Security Semiconductor Circuits Systems Dependability VLSI Design and Test Very Large Scale Integration quality control, reliability, safety and risk