Ergebnisse für: Test Generation With Optimisation Constraints

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Efficiency and Applications of SAT-Based Test Pattern Generation - Complex fault models and optimisation problems.

Alexander Czutro
Der Andere Verlag
49.9 € · Buch

Complex Defect Mechanisms Dynamic Compaction Generic Fault Models Sat Solving With Qualitative Preferences Sat – based test pattern Generation Test Generation With Optimisation Constraints

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