Ergebnisse für: Sampling-Based Estimation
Hier findest Du Bücher, die sich mit Sampling-Based Estimation beschäftigen.
The goal of this book is to put an array of tools at the fingertips of students, practitioners, and researchers by explaining approaches long used by survey statisticians, illustrating how existing software can be used to solve survey problems, and developing some specialized software where needed.&...
Knowledge exists: you only have to ?nd it VLSI design has come to an important in?ection point with the appearance of large manufacturing variations as semiconductor technology has moved to 45 nm feature sizes and below. If we ignore the random variations in the manufacturing process, simulation-bas...
Knowledge exists: you only have to ?nd it VLSI design has come to an important in?ection point with the appearance of large manufacturing variations as semiconductor technology has moved to 45 nm feature sizes and below. If we ignore the random variations in the manufacturing process, simulation-bas...
Microwave imaging techniques allow for the development of systems that are able to inspect, identify, and characterize in a noninvasive fashion under different scenarios, ranging from biomedical to subsurface diagnostics as well as from surveillance and security applications to nondestructive evalua...
The goal of this book is to put an array of tools at the fingertips of students, practitioners, and researchers by explaining approaches long used by survey statisticians, illustrating how existing software can be used to solve survey problems, and developing some specialized software where needed.&...
The goal of this book is to put an array of tools at the fingertips of students, practitioners, and researchers by explaining approaches long used by survey statisticians, illustrating how existing software can be used to solve survey problems, and developing some specialized software where needed.&...
Knowledge exists: you only have to ?nd it VLSI design has come to an important in?ection point with the appearance of large manufacturing variations as semiconductor technology has moved to 45 nm feature sizes and below. If we ignore the random variations in the manufacturing process, simulation-bas...
Quantum information has dramatically changed information science and technology, looking at the quantum nature of the information carrier as a resource for building new information protocols, designing radically new communication and computation algorithms, and ultra-sensitive measurements in metrol...
Monitoring of vegetation structure and functioning is critical to modeling terrestrial ecosystems and energy cycles. In particular, leaf area index (LAI) is an important structural property of vegetation used in many land surface vegetation, climate, and crop production models. Canopy structure (LAI...