SRAM – Bücher zum Thema SRAM finden und kaufen

Buch Cover Nanometer Variation-Tolerant SRAM

Mohamed Abu Rahma, Mohab Anis
Springer US
106.99 € · Hardcover

Embedded Systems Integrated Circuit Design Integrated Circuit Variability Reliable Integrated Circuits Robust Integrated Circuits

Variability is one of the most challenging obstacles for IC design in the nanometer regime.  In nanometer technologies, SRAM show an increased sensitivity to process variations due to low-voltage operation requirements, which are aggravated by the strong demand for lower power consumption and c...

Robust SRAM Designs and Analysis

Jawar Singh, Saraju P. Mohanty, Dhiraj K. Pradhan
Springer US
149.79 € · Hardcover

Emerging memory Power-aware circuit design Power-aware memory design SRAM bitcell Static Random Access Memory System-on-Chip Tunnel FET Variation-tolerant memory design

This book provides a guide to Static Random Access Memory (SRAM) bitcell design and analysis to meet the nano-regime challenges for CMOS devices and emerging devices, such as Tunnel FETs. Since process variability is an ongoing challenge in large memory arrays, this book highlights the most popular ...

SRAM Design for Wireless Sensor Networks

Vibhu Sharma, Francky Catthoor, Wim Dehaene
Springer US
106.99 € · Hardcover

Analog Circuits and Signal Processing Energy Efficient SRAM Circuit Design SRAM Circuit Design Variability Resilient SRAM Circuit Design Wireless Sensor Networks

This book features various, ultra low energy, variability resilient SRAM circuit design techniques for wireless sensor network applications. Conventional SRAM design targets area efficiency and high performance at the increased cost of energy consumption, making it unsuitable for computation-intensi...

Fault-Tolerance Techniques for SRAM-Based FPGAs

Fernanda Lima Kastensmidt, Ricardo Reis
Springer US
106.99 € · Hardcover

Digital Systems Design Fault-tolerance Field Programmable Gate Arrays Filter Programmable Logic ROM Reliability Testing Transistor VHDL integrated circuit logic microprocessor model

Fault-tolerance in integrated circuits is not an exclusive concern regarding space designers or highly-reliable application engineers. Rather, designers of next generation products must cope with reduced margin noises due to technological advances. The continuous evolution of the fabrication technol...

Variation-Aware Advanced CMOS Devices and SRAM

Changhwan Shin
Springer Netherland
53.49 € · Hardcover

CMOS Device Designs Integrated circuits Line Edge Roughness MOSFET Process-Induced Random Variation Random Dopant Fluctuation Static Random Access Memory Variation-Robust CMOS Work-function Variation

This book provides a comprehensive overview of contemporary issues in complementary metal-oxide semiconductor (CMOS) device design, describing how to overcome process-induced random variations such as line-edge-roughness, random-dopant-fluctuation, and work-function variation, and the applications o...

Low Power and Reliable SRAM Memory Cell and Array Design

Springer Berlin
106.99 € · Hardcover

CMOS LSI Memory cell Reliability SRAM Study

Success in the development of recent advanced semiconductor device technologies is due to the success of SRAM memory cells. This book addresses various issues for designing SRAM memory cells for advanced CMOS technology. To study LSI design, SRAM cell design is the best materials subject because iss...

Nanometer Variation-Tolerant SRAM

Mohamed Abu Rahma, Mohab Anis
Springer US
106.99 € · Paperback

Embedded Systems Integrated Circuit Design Integrated Circuit Variability Reliable Integrated Circuits Robust Integrated Circuits

Variability is one of the most challenging obstacles for IC design in the nanometer regime.  In nanometer technologies, SRAM show an increased sensitivity to process variations due to low-voltage operation requirements, which are aggravated by the strong demand for lower power consumption and c...