Ergebnisse für: Junction temperature estimation
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This book focuses on the thermal reliability of power semiconductor device by looking at the failure mechanism, thermal parameters monitoring, junction temperature estimation, lifetime evaluation, and thermal management. Theoretical analysis and experimental tests are presented to explain existing r...
Das Ziel der vorliegenden Dissertation ist die Untersuchung der Langzeitstabilität von CIGS-Dünnschichtsolarzellen. Basis der Untersuchungen sind beschleunigte Alterungstests. Eine elementare Erkenntnis der beschleunigten Alterungstests war, dass das Verhalten bei tiefen Temperaturen im Ausgangszu...
This book focuses on the thermal reliability of power semiconductor device by looking at the failure mechanism, thermal parameters monitoring, junction temperature estimation, lifetime evaluation, and thermal management. Theoretical analysis and experimental tests are presented to explain existing r...
This book focuses on the thermal reliability of power semiconductor device by looking at the failure mechanism, thermal parameters monitoring, junction temperature estimation, lifetime evaluation, and thermal management. Theoretical analysis and experimental tests are presented to explain existing r...