Ergebnisse für: CMOS Testing and Yield

Hier findest Du Bücher, die sich mit CMOS Testing and Yield beschäftigen.

Buch Cover From Contamination to Defects, Faults and Yield Loss
From Contamination to Defects, Faults and Yield Loss
Jitendra B. Khare, Wojciech Maly
Springer US
106.99 € · Hardcover
CMOS VLSI circuit design computer integrated circuit manufacturing material mechanism model modeling physics simulation testing transistor
Over the years there has been a large increase in the functionality available on a single integrated circuit. This has been mainly achieved by a continuous drive towards smaller feature sizes, larger dies, and better packing efficiency. However, this greater functionality has also resulted in su...
Buch Cover Nanometer CMOS ICs
Nanometer CMOS ICs
Harry Veendrick
Springer International Publishing
128.39 € · Hardcover
Basic CMOS physics Nanometer CMOS process and design CMOS Nanoelectronics Low-power CMOS design CMOS Reliability and Signal Integrity CMOS Testing and Yield CMOS Packaging and Failure Analysis CMOS scaling trends and cost
This textbook provides a comprehensive, fully-updated introduction to the essentials of nanometer CMOS integrated circuits. It includes aspects of scaling to even beyond 3nm CMOS technologies and designs. It clearly describes the fundamental CMOS operating principles and presents substanti...
Buch Cover From Contamination to Defects, Faults and Yield Loss
From Contamination to Defects, Faults and Yield Loss
Jitendra B. Khare, Wojciech Maly
Springer US
106.99 € · Paperback
CMOS VLSI circuit design computer integrated circuit manufacturing material mechanism model modeling physics simulation testing transistor
Over the years there has been a large increase in the functionality available on a single integrated circuit. This has been mainly achieved by a continuous drive towards smaller feature sizes, larger dies, and better packing efficiency. However, this greater functionality has also resulted in su...
Buch Cover From Contamination to Defects, Faults and Yield Loss
From Contamination to Defects, Faults and Yield Loss
Jitendra B. Khare, Wojciech Maly
Springer US
96.29 € · eBook
CMOS VLSI circuit design computer integrated circuit manufacturing material mechanism model modeling physics simulation testing transistor
Over the years there has been a large increase in the functionality available on a single integrated circuit. This has been mainly achieved by a continuous drive towards smaller feature sizes, larger dies, and better packing efficiency. However, this greater functionality has also resulted in su...
Buch Cover Nanometer CMOS ICs
Nanometer CMOS ICs
Harry Veendrick
Springer International Publishing
128.39 € · eBook
Basic CMOS physics Nanometer CMOS process and design CMOS Nanoelectronics Low-power CMOS design CMOS Reliability and Signal Integrity CMOS Testing and Yield CMOS Packaging and Failure Analysis CMOS scaling trends and cost
This textbook provides a comprehensive, fully-updated introduction to the essentials of nanometer CMOS integrated circuits. It includes aspects of scaling to even beyond 3nm CMOS technologies and designs. It clearly describes the fundamental CMOS operating principles and presents substanti...
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