Ergebnisse für: AEC-Q100

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New Approaches to Reliability Qualification of Semiconductor Components under Varying and Progressive Stresses

Alexander Hirler
Cuvillier Verlag
58.68 € · Buch

AEC-Q100 Arrhenius model Arrhenius-Modell Ausfalldaten Ausfallverteilung Automobilanwendung Automobilelektronik Beschleunigungsmodell Cox's proportional hazard Cox's proportionales Risiko Elektromobilität Exponential-E-Modell Extrapolation der Lebensdauer Fahrerassistenz Halbleiterbauelement

In the present work, urgent issues in the reliability qualification of semiconductor devices are addressed, which particularly affect value chains such as those in the automotive industry. These have particularly high requirements for long lifetime and low failure rates of their products, which are ...

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