Ergebnisse für: Microelectronics test structures

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Buch Cover Microelectronic Test Structures for CMOS Technology
Microelectronic Test Structures for CMOS Technology
Manjul Bhushan, Mark B. Ketchen
Springer US
192.59 € · Hardcover
Bhushan CMOS CMOS Process CMOS technology Circuit design Ketchen Manjul Bhushan Manufacturability Mark B. Ketchen Microelectronics Microelectronics test structures Silicon chip design Silicon chip manufacturing Silicon fabrication Silicon manufacturing
Microelectronic Test Structures for CMOS Technology and Products addresses the basic concepts of the design of test structures for incorporation within test-vehicles, scribe-lines, and CMOS products. The role of test structures in the development and monitoring of CMOS technologies and products has ...
Buch Cover Microelectronic Test Structures for CMOS Technology
Microelectronic Test Structures for CMOS Technology
Manjul Bhushan, Mark B. Ketchen
Springer US
139.09 € · Paperback
Bhushan CMOS CMOS Process CMOS technology Circuit design Ketchen Manjul Bhushan Manufacturability Mark B. Ketchen Microelectronics Microelectronics test structures Silicon chip design Silicon chip manufacturing Silicon fabrication Silicon manufacturing
Microelectronic Test Structures for CMOS Technology and Products addresses the basic concepts of the design of test structures for incorporation within test-vehicles, scribe-lines, and CMOS products. The role of test structures in the development and monitoring of CMOS technologies and products has ...
Buch Cover Microelectronic Test Structures for CMOS Technology
Microelectronic Test Structures for CMOS Technology
Manjul Bhushan, Mark B. Ketchen
Springer US
128.39 € · eBook
Bhushan CMOS CMOS Process CMOS technology Circuit design Ketchen Manjul Bhushan Manufacturability Mark B. Ketchen Microelectronics Microelectronics test structures Silicon chip design Silicon chip manufacturing Silicon fabrication Silicon manufacturing
Microelectronic Test Structures for CMOS Technology and Products addresses the basic concepts of the design of test structures for incorporation within test-vehicles, scribe-lines, and CMOS products. The role of test structures in the development and monitoring of CMOS technologies and products has ...
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