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Variation-Aware Advanced CMOS Devices and SRAM

Changhwan Shin
Springer Netherland
53.49 € · Hardcover

CMOS Device Designs Integrated circuits Line Edge Roughness MOSFET Process-Induced Random Variation Random Dopant Fluctuation Static Random Access Memory Variation-Robust CMOS Work-function Variation

This book provides a comprehensive overview of contemporary issues in complementary metal-oxide semiconductor (CMOS) device design, describing how to overcome process-induced random variations such as line-edge-roughness, random-dopant-fluctuation, and work-function variation, and the applications o...

Variation-Aware Advanced CMOS Devices and SRAM

Changhwan Shin
Springer Netherland
53.49 € · eBook

CMOS Device Designs Integrated circuits Line Edge Roughness MOSFET Process-Induced Random Variation Random Dopant Fluctuation Static Random Access Memory Variation-Robust CMOS Work-function Variation

This book provides a comprehensive overview of contemporary issues in complementary metal-oxide semiconductor (CMOS) device design, describing how to overcome process-induced random variations such as line-edge-roughness, random-dopant-fluctuation, and work-function variation, and the applications o...

Variation-Aware Advanced CMOS Devices and SRAM

Changhwan Shin
Springer Netherland
53.49 € · Paperback

CMOS Device Designs Integrated circuits Line Edge Roughness MOSFET Process-Induced Random Variation Random Dopant Fluctuation Static Random Access Memory Variation-Robust CMOS Work-function Variation

This book provides a comprehensive overview of contemporary issues in complementary metal-oxide semiconductor (CMOS) device design, describing how to overcome process-induced random variations such as line-edge-roughness, random-dopant-fluctuation, and work-function variation, and the applications o...

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