Yanan Yue Yue Raman Thermometry

Raman Thermometry

von Yanan Yue

For Micro/Nanoscale Characterization

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Beschreibung

This book provides a comprehensive overview of recent progress in Raman-based micro/nanoscale thermal characterization. The continuous miniaturization of electronic devices has created an urgent demand for efficient thermal design and management. At the nanoscale, accurate determination of thermophysical properties of materials becomes critical, driving the need for advanced characterization methods. Among these, Raman spectroscopy has emerged as a powerful and distinctive approach to micro- and nanoscale thermal characterization—commonly referred to as Raman thermometry. This technique enables noncontact, localized temperature measurements with high spatial resolution, greatly advancing the study of next-generation materials and structures such as two-dimensional materials, their heterostructures, and wide-bandgap semiconductors. It introduces the fundamental measurement principles, describes experimental setups, and presents illustrative case studies. In addition, the limitations and challenges of the technique are critically discussed, with the aim of deepening understanding and guiding future applications of Raman thermometry in thermal science and technology.
This book provides a comprehensive overview of recent progress in Raman-based micro/nanoscale thermal characterization. The continuous miniaturization of electronic devices has created an urgent demand for efficient thermal design and management. At the nanoscale, accurate determination of thermophysical properties of materials becomes critical, driving the need for advanced characterization methods. Among these, Raman spectroscopy has emerged as a powerful and distinctive approach to micro- and nanoscale thermal characterization—commonly referred to as Raman thermometry. This technique enables noncontact, localized temperature measurements with high spatial resolution, greatly advancing the study of next-generation materials and structures such as two-dimensional materials, their heterostructures, and wide-bandgap semiconductors. It introduces the fundamental measurement principles, describes experimental setups, and presents illustrative case studies. In addition, the limitations and challenges of the technique are critically discussed, with the aim of deepening understanding and guiding future applications of Raman thermometry in thermal science and technology.
Provides the first comprehensive overview of Raman thermometry for micro/nanoscale thermal characterization Bridges experimental techniques with real applications in electronics, energy, and advanced manufacturing Explores cutting-edge topics such as tip-enhanced Raman thermometry, Phonon non-equilibrium and AI-assisted analysis

Autor*in

Yanan Yue

Themen in »Raman Thermometry«

Microscale Convective Heat Transfer Interfacial Thermal Transport Transient Raman Characterization Tip-Enhanced Raman Thermometry Raman Thermometry Low-Dimensional Materials Phonon Nonequilibrium Near-field Heat Transfer Nanoparticle and Nanobubble Thermal Energy Storage AI-assisted Raman thermometry

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Details

ISBN: 9789819559855
Verlag: Springer Singapore
Erscheinung: 02.01.2026

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