Rui Lan Lan Thermophysical Properties and Measuring Technique of Ge-Sb-Te Alloys for Phase Change Memory

Thermophysical Properties and Measuring Technique of Ge-Sb-Te Alloys for Phase Change Memory

von Rui Lan

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Beschreibung

This book focuses on the thermophysical properties of Ge-Sb-Te alloys, which are the most widely used phase change materials, and the technique for measuring them. Describing the measuring procedure and parameter calibration in detail, it provides readers with an accurate method for determining the thermophysical properties of phase change materials and other related materials. Further, it discusses combining thermal and electrical conductivity data to analyze the conduction mechanism, allowing readers to gain an understanding of phase change materials and PCM industry simulation.
This book focuses on the thermophysical properties of Ge-Sb-Te alloys, which are the most widely used phase change materials, and the technique for measuring them. Describing the measuring procedure and parameter calibration in detail, it provides readers with an accurate method for determining the thermophysical properties of phase change materials and other related materials. Further, it discusses combining thermal and electrical conductivity data to analyze the conduction mechanism, allowing readers to gain an understanding of phase change materials and PCM industry simulation.
Introduces the thermophysical properties and theory of Ge-Sb-Te alloys Describes measuring techniques for thermal conductivity, electrical resistivity, and density Studies comprehensively the thermal conductivity and conduction mechanism of Ge-Sb-Te alloys

Autor*in

Rui Lan

Themen in »Thermophysical Properties and Measuring Technique of Ge-Sb-Te Alloys for Phase Change Memory«

Phase change memory Ge-Sb-Te alloys Thermal conductivity Electrical conductivity Density measurement Measuring technique Thermophysical properties Phase change materials

Stimmen zu »Thermophysical Properties and Measuring Technique of Ge-Sb-Te Alloys for Phase Change Memory«

Details

ISBN: 9789811522178
Verlag: Springer Singapore
Erscheinung: 07.01.2020

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