Field Emission Scanning Electron Microscopy
New Perspectives for Materials Characterization
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Beschreibung
This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM/-TEM) historically run at higher beam accelerating voltage
Includes supplementary material: sn.pub/extras
Autor*in
Nicolas Brodusch
Themen in »Field Emission Scanning Electron Microscopy«
Field emission gun technologies Ionic liquid treatment Dual in-lens electron detection Low voltage SEM X-ray imaging Silicon drift detector Electron Channeling Contrast Imaging Electron Backscatter Diffraction Magnetic domain imaging Dark-Field Imaging