Design of a Hybrid Digital-Analog Power Supply for Semiconductor Testing on Automated Test Equipment
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Beschreibung
Modern semiconductor testing requires power delivery systems that are not only precise, but also able to respond to rapidly changing conditions. Conventional power supply architectures in automated test equipment are increasingly pushed to their limits by the complex and dynamic behavior of modern devices, which can affect both the accuracy of applied stimuli and the reliability of measurements.
This work presents a hybrid digital–analog control approach to address these challenges. By combining the strengths of analog circuitry with the flexibility of digital control, the system can adapt its behavior during operation. In particular, time-variant control strategies are used to improve transient response, stability, and overall measurement consistency across different test conditions.
Experimental results show that this hybrid approach can mitigate several of the known limitations of traditional designs without adding unnecessary system complexity. The concept offers a practical path toward more robust and adaptable power delivery in automated test systems, supporting more reliable characterization and qualification of semiconductor devices.
Autor*in
Saeid Yazdani
Themen in »Design of a Hybrid Digital-Analog Power Supply for Semiconductor Testing on Automated Test Equipment«
Halbleiter Regelungstechnik Leistungselektronik Messtechnik