1st Sino-German Workshop on Intelligent Sensing and Metrology

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Contents: High-Dimensional Computational Imaging Based on Structured Illumination GPU-Based Raytracing Simulation for the Identification of Low-Reflection Measurement Poses Fringe Projection Profilometry: Expansion in Algorithm and Technique Inspection Window Measurement System A New Method for Multi-Scale Fringe-Projection 3D Scanner Evaluation and for Modeling Surface Normal Dependent Influencing Factors of Local Phase Measurement Uncertainty Non-Line-of-Sight-Imaging Phase Error Compensation Using Deep Learning Measurement Data Registration: Comparision of Classical and ML Methods

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Eduard Reithmeier

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