Christian Geiser Geiser Multitrait-Multimethod-Multioccasion Modeling

Multitrait-Multimethod-Multioccasion Modeling

von Christian Geiser

EUR 79,90

Buch in deiner Nähe kaufen


...oder deine aktuelle Postleitzahl eingeben:
oder

Beschreibung

The author reviews structural equation approaches to modeling multitrait-multimethod (MTMM) longitudinal data and defines new models based on stochastic measurement theory. The new models can be used to analyze latent states and latent change in an MTMM context. The author provides a detailed psychometric analysis of the new models and illustrates their use in an empirical application. He also presents a Monte Carlo simulation study, in which the applicability of the models is scrutinized for different sample sizes. The author discusses various practical modeling issues in detail, such as model selection, testing of measurement invariance, dealing with indicator-specific effects over time, and assessment of convergent and discriminant validity of change. In the final section, the author compares the new models to alternative approaches, discusses advantages and limitations, and provides detailed guidelines for applied researchers.

Autor*in

Christian Geiser

Themen in »Multitrait-Multimethod-Multioccasion Modeling«

Klassische Testtheorie classical test theory Längsschnittanalyse Strukturgleichungsmodelle latent variables structural equation modeling Multitrait-Multimethod measurement theory longitudinal multioccasion statistics latente Variablen Validität Messtheorie latent change

Stimmen zu »Multitrait-Multimethod-Multioccasion Modeling«

Details

ISBN: 9783899759099
Verlag: Akademische Verlagsgemeinschaft München
Erscheinung: 03.2009

Link teilen


Über buchnah.de | Die Buchhandlungen | Die Verlage | Impressum & Kontakt | Datenschutz | Presse


Auf dieser Seite kannst Du Buchhandlungen in der Nähe finden