The 33rd annual Workshop of the Austrian Association for Pattern Recognition
(OAGM/AAPR) was held in the Veranstaltungs- & Tagungszentrum Hofermühle Stainz
from May 14-15, 2009 and was organized by the Institute of Computer Graphics and
Vision from Graz University of Technology.
The workshop provides a platform bringing together researchers for discussing
traditional and new areas of the computer vision discipline. It is organized
as a peer-reviewed conference presenting the latest work of Austrian and
international researchers in the domain of computer vision, image analysis, and
pattern recognition.
This year's main topic was Visual Learning, which has become an important
research field in computer vision within the last years. Thus, special attention
was paid for this topic concerning the invited presentations as well as the
submitted work. In total 39 papers from seven countries were submitted to
the workshop from which finally 23 (acceptance rate of 58,97%) were selected for
presentation at the workshop.
Editors: P. M. Roth, Th. Mauthner, Th. Pock
The 33rd annual Workshop of the Austrian Association for Pattern Recognition
(OAGM/AAPR) was held in the Veranstaltungs- & Tagungszentrum Hofermühle Stainz
from May 14-15, 2009 and was organized by the Institute of Computer Graphics and
Vision from Graz University of Technology.
The workshop provides a platform bringing together researchers for discussing
traditional and new areas of the computer vision discipline. It is organized
as a peer-reviewed conference presenting the latest work of Austrian and
international researchers in the domain of computer vision, image analysis, and
pattern recognition.
This year's main topic was Visual Learning, which has become an important
research field in computer vision within the last years. Thus, special attention
was paid for this topic concerning the invited presentations as well as the
submitted work. In total 39 papers from seven countries were submitted to
the workshop from which finally 23 (acceptance rate of 58,97%) were selected for
presentation at the workshop.
Editors: P. M. Roth, Th. Mauthner, Th. Pock