David Slepicka Slepicka Methods of Identification and Correction of Test Signal Imperfections used for Testing ADC Dynamic Parameters

Methods of Identification and Correction of Test Signal Imperfections used for Testing ADC Dynamic Parameters

von David Slepicka

EUR 45,80

Buch in deiner Nähe kaufen


...oder deine aktuelle Postleitzahl eingeben:
oder

Beschreibung

In the field of analog-to-digital converter (ADC) testing many types of test signals are applied for the evaluation of ADC dynamic parameters. The research introduced in this thesis is focused on the standardized and most common test signal—sine wave. Several possible imperfections of this signal are analyzed and, if necessary, their correction or an alternative method described. In addition, test systems of several European laboratories are compared because of the portability of results of ADC testing. For this purpose a new transportable high-stable reference ADC device was designed and the first prototype made.

Autor*in

David Slepicka

Themen in »Methods of Identification and Correction of Test Signal Imperfections used for Testing ADC Dynamic Parameters«

Reports on Sensors and Instrumentation Slepicka Technik

Stimmen zu »Methods of Identification and Correction of Test Signal Imperfections used for Testing ADC Dynamic Parameters«

Details

ISBN: 9783832277390
Verlag: Shaker
Erscheinung: 03.2010

Link teilen


Über buchnah.de | Die Buchhandlungen | Die Verlage | Impressum & Kontakt | Datenschutz | Presse


Auf dieser Seite kannst Du Buchhandlungen in der Nähe finden