Resolving locations of defects in superconducting transmon qubits
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Beschreibung
Despite tremendous progress of quantum computation with superconducting qubits, up-scaling for practical applications is hindered by decoherence and fluctuations induced by material defects. In this work, a qubit interface has been developed to study the microscopic nature of individual defects in a probe material. Further, a portable method has been developed to find locations of individual defects in ready-made qubit samples, which offers to test and improve micro-fabrication of qubits.
Despite tremendous progress of quantum computation with superconducting qubits, up-scaling for practical applications is hindered by decoherence and fluctuations induced by material defects. In this work, a qubit interface has been developed to study the microscopic nature of individual defects in a probe material. Further, a portable method has been developed to find locations of individual defects in ready-made qubit samples, which offers to test and improve micro-fabrication of qubits.
Autor*in
Alexander Bilmes
Themen in »Resolving locations of defects in superconducting transmon qubits«
Quanten Bits quantum computing material defects and decoherence Materialdefekte und Dekohärenz Quantum bit Quantenrechner spectroscopy of defects with dc-electric and elastic fields transmon qubit Defektspektroskopie mitt elektrischer und elastischer Felder Transmon Qubit