Jürgen [Hrsg.] Beyerer Beyerer OCM 2015 - Optical Characterization of Materials - conference proceedings

OCM 2015 - Optical Characterization of Materials - conference proceedings

von Jürgen [Hrsg.] Beyerer

EUR 52,00

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Beschreibung

Each material has its own specific spectral signature independent if it is food, plastics, or minerals. During the conference we will discuss new trends and developments in material characterization. You also will be informed about latest highlights to identify spectral footprints and their realizations in industry.
Each material has its own specific spectral signature independent if it is food, plastics, or minerals. During the conference we will discuss new trends and developments in material characterization. You also will be informed about latest highlights to identify spectral footprints and their realizations in industry.

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Jürgen [Hrsg.] Beyerer

Themen in »OCM 2015 - Optical Characterization of Materials - conference proceedings«

Food Inspection Materialerkennung Spektral Schüttgutsortierung Waste and Plastic Recycling Messdatenverarbeitung Spectral Data Processing Material Signatur KCM

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Details

ISBN: 9783731503187
Verlag: KIT Scientific Publishing
Erscheinung: 18.03.2015

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