Transmission Electron Microscopy and Diffractometry of Materials
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Beschreibung
This book teaches graduate students the concepts of trans- mission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materi- als. It emphasizes themes common to both techniques, such as scattering from atoms and the formation and analysis of dif- fraction patterns. It also describes unique aspects of each technique, especially imaging and spectroscopy in the TEM. The textbook thoroughly develops both introductory and ad- vanced-level material, using over 400 accompanying illustra- tions. Problems are provided at the end of each chapter to reinforce key concepts. Simple citatioins of rules are avoi- ded as much as possible, and both practical and theoretical issues are explained in detail. The book can be used as both an introductory and advanced-level graduate text since sec- tions/chapters are sorted according to difficulty and grou- ped for use in quarter and semester courses on TEM and XRD.
This book appeals to the broad readership of advanced students and scientists in transmission electron microscopy. It is the most comprehensive and experimentally oriented textbook in the field.
Designed to meet the needs of materials scientists, including students, teachers and researchers It can be used as both an introductory and advanced level graduate text Chapters are sorted according to difficulty and grouped for use in quarter and semester courses Problems for the student are appended to each chapter Includes supplementary material: sn.pub/extras
Autor*in
Brent Fultz
Themen in »Transmission Electron Microscopy and Diffractometry of Materials«
Imaging Powder diffraction X-ray crystal crystallography diffraction dispersion electron electron diffraction electron microscopy materials characterization microscopy scattering spectroscopy transmission electron microscopy