Structural Analysis of Point Defects in Solids
An Introduction to Multiple Magnetic Resonance Spectroscopy
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Beschreibung
Strutural Analysis of Point Defects in Solids introduces the
principles and techniques of modern electron paramagnetic
resonance (EPR) spectroscopy essentialfor applications to
the determination of microscopic defect
structures. Investigations of the microscopic and electronic
structure, and also correlations with the
magnetic propertiesof solids, require various multiple
magnetic resonance methods, such as ENDOR and optically
detected EPR or ENDOR. This book discusses experimental,
technological and theoretical aspects of these techniques
comprehensively, from a practical viewpoint, with many
illustrative examples taken from semiconductors and other
solids. The nonspecialist is informed about the potential of
the different methods, while the researcher faced with the
task of determining defect structures isprovided with the
necessary tools, together with much information on
computer-aided methods of data analysis and the principles
of modern spectrometer design.
Structural Analysis of Point Defects in Solids provides a comprehensive introduction to the principles and techiques of modern electron paramagnetic resonance spectroscopy applied to the determination of microscopic defect structures. It informs the nonspecialist about the potential of the different methods, while the researcher faced with the task of determining defect structures will find here the necessary tools. The book will be useful for materials scientists working in semiconductor physics, laser physics, radiation damage, etc., and also for mineralogists and solid state chemists.
Autor*in
Johann-Martin Spaeth
Themen in »Structural Analysis of Point Defects in Solids«
Absorption ENDOR Electron paramagnetic resonance NMR Pseudopotential Sorption crystal electron electronics point defects semiconductor spectroscopy structure