Zoubir Raman Imaging

Raman Imaging

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Techniques and Applications

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Beschreibung

Raman imaging has long been used to probe the chemical nature of a sample, providing information on molecular orientation, symmetry and structure with sub-micron spatial resolution. Recent technical developments have pushed the limits of micro-Raman microscopy, enabling the acquisition of Raman spectra with unprecedented speed, and opening a pathway to fast chemical imaging for many applications from material science and semiconductors to pharmaceutical drug development and cell biology, and even art and forensic science. The promise of tip-enhanced raman spectroscopy (TERS) and near-field techniques is pushing the envelope even further by breaking the limit of diffraction and enabling nano-Raman microscopy.


Raman imaging has long been used to probe the chemical nature of a sample, providing information on molecular orientation, symmetry and structure with sub-micron spatial resolution. Recent technical developments have pushed the limits of micro-Raman microscopy, enabling the acquisition of Raman spectra with unprecedented speed, and opening a pathway to fast chemical imaging for many applications from material science and semiconductors to pharmaceutical drug development and cell biology, and even art and forensic science. The promise of tip-enhanced raman spectroscopy (TERS) and near-field techniques is pushing the envelope even further by breaking the limit of diffraction and enabling nano-Raman microscopy.


Comprehensive book on the state of the art in Raman spectroscopy concerning the development of methods and applications Provides information on how to significantly improve the speed of Raman analysis and on new application fields Both a valuable reference work for researchers and a study text for graduate students Includes supplementary material: sn.pub/extras

Autor*in

Arnaud Zoubir

Themen in »Raman Imaging«

Mapping Nearfield Raman imaging Spectroscopy TERS Biological Microscopy

Stimmen zu »Raman Imaging«

Details

ISBN: 9783642282522
Verlag: Springer Berlin
Erscheinung: 27.07.2012

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