Kelvin Probe Force Microscopy
Measuring and Compensating Electrostatic Forces
Buch in deiner Nähe kaufen
Beschreibung
In the nearly 20 years of Kelvin probe force microscopy an increasing interest in the technique and its applications has developed. This book gives a concise introduction into the method and describes various experimental techniques. Surface potential studies on semiconductor materials, nanostructures and devices are described, as well as application to molecular and organic materials. The current state of surface potential at the atomic scale is also considered. This book presents an excellent introduction for the newcomer to this field, as much as a valuable resource for the expert.
Over the nearly 20 years of Kelvin probe force microscopy, an increasing interest in the technique and its applications has developed. This book gives a concise introduction into the method and describes various experimental techniques. Surface potential studies on semiconductor materials, nanostructures and devices are described, as well as application to molecular and organic materials. The current state of surface potential at the atomic scale is also considered. This book presents an excellent introduction for the newcomer to this field, as much as a valuable resource for the expert.
First book dedicated soley to Kelvin force microscopy Explains basics, realization, modulation and data interpretation Provides important application examples Useful reference to researchers and graduate students alike Includes supplementary material: sn.pub/extras
Autor*in
Sascha Sadewasser
Themen in »Kelvin Probe Force Microscopy«
Kelvin probe microscopy Nanotechnology Scanning probe microscopy Surface potential Surface science