Hui Xie Cagdas Onal Stéphane Régnier Metin Sitti Xie Atomic Force Microscopy Based Nanorobotics

Atomic Force Microscopy Based Nanorobotics

von Hui Xie Cagdas Onal Stéphane Régnier Metin Sitti

Modelling, Simulation, Setup Building and Experiments

Preis unbekannt

Buch in deiner Nähe kaufen


...oder deine aktuelle Postleitzahl eingeben:
oder

Beschreibung

The atomic force microscope (AFM) has been successfully used to perform nanorobotic manipulation operations on nanoscale entities such as particles, nanotubes, nanowires, nanocrystals, and DNA since 1990s.

There have been many progress on modeling, imaging, teleoperated or automated control, human-machine interfacing, instrumentation, and applications of AFM based nanorobotic manipulation systems in literature. This book aims to include all of such state-of-the-art progress in an organized, structured, and detailed manner as a reference book and also potentially a textbook in nanorobotics and any other nanoscale dynamics, systems and controls related research and education.

Clearly written and well-organized, this text introduces designs and prototypes of the nanorobotic systems in detail with innovative principles of three-dimensional manipulation force microscopy and parallel imaging/manipulation force microscopy.


The atomic force microscope (AFM) has been successfully used to perform nanorobotic manipulation operations on nanoscale entities such as particles, nanotubes, nanowires, nanocrystals, and DNA since 1990s.

There have been many progress on modeling, imaging, teleoperated or automated control, human-machine interfacing, instrumentation, and applications of AFM based nanorobotic manipulation systems in literature. This book aims to include all of such state-of-the-art progress in an organized, structured, and detailed manner as a reference book and also potentially a textbook in nanorobotics and any other nanoscale dynamics, systems and controls related research and education.

Clearly written and well-organized, this text introduces designs and prototypes of the nanorobotic systems in detail with innovative principles of three-dimensional manipulation force microscopy and parallel imaging/manipulation force microscopy.


Presents new ideas for three-dimensional and high-efficiency parallel nanomanipulation using newly developed nanorobots based on the principle of atomic force microscopy Clearly written and well-organized, this text introduces designs and prototypes of the nanorobotic systems Extensive review of nanorobotics history, principles of atomic force microscopy, modelling of pick-and-place nanomanipulation, and design and development of nanorobotic systems Includes experimental results and extended applications of the proposed nanorobotic systems

Autor*in

Hui Xie

Themen in »Atomic Force Microscopy Based Nanorobotics«

3-D atomic force microscope Nano robotics high-speed atomic force microscope parallel imaging/manipulation force microscope

Stimmen zu »Atomic Force Microscopy Based Nanorobotics«

Details

ISBN: 9783642203299
Verlag: Springer Berlin
Erscheinung: 25.09.2011

Link teilen


Über buchnah.de | Die Buchhandlungen | Die Verlage | Impressum & Kontakt | Datenschutz | Presse


Auf dieser Seite kannst Du Buchhandlungen in der Nähe finden