Characterization of Microstructures by Analytical Electron Microscopy (AEM)
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Beschreibung
This book reviews basic concepts and operative techniques of AEM, focusing on the study of phase transformations and dislocation in deformation by AEM. Numerous examples illustrate physical concepts and mathematic analysis for diffraction and crystallography.
"Characterization of Microstructures by Analytical Electron Microscopy (AEM)" describes the basic concepts and operative techniques of AEM. It focuses on the study of phase transformations and dislocation in deformation by AEM. Further, the book also presents the physical concepts and mathematic analysis for diffraction and crystallography using numerous examples, such as the quantitative prediction of the orientation relationships in phase transformations. The book is intended for researchers and graduate students in materials science and engineering, and condensed matter physics. Yonghua Rong is a professor at School of Materials Science and Engineering, Shanghai Jiao Tong University, China.
Autor*in
Yonghua Rong
Themen in »Characterization of Microstructures by Analytical Electron Microscopy (AEM)«
AEM Analytical electron microscopy Electron diffraction Imaging Martensite Steel TEM Transmission electron microscopy