Lock-in Thermography
Basics and Use for Evaluating Electronic Devices and Materials
Buch in deiner Nähe kaufen
Beschreibung
This is the first book on lock-in thermography, an analytical method applied to the diagnosis of microelectronic devices. This useful introduction and guide reviews various experimental approaches to lock-in thermography, with special emphasis on the lock-in IR thermography developed by the authors themselves.
This is the first book on lock-in thermography, an analytical method applied to the diagnosis of microelectronic devices. It provides the necessary knowledge on the scientific basics and application of this method. It appeals to electrical engineers, researchers and advanced students.
Autor*in
Otwin Breitenstein
Themen in »Lock-in Thermography«
Failure analysis Lifetime mapping Shunt imaging Solar cell characterization Trap density mapping