Scanning Probe Microscopy in Nanoscience and Nanotechnology
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Beschreibung
This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective. With a foreword by the co-inventor of AFM, Christoph Gerber
Scientific reviews on scanning tunneling microscopy and atomic force microscopy Integrates basic scientific and applicational aspects With a foreword by the co-inventor of AFM, Christoph Gerber Useful reference to researchers and graduate students
Autor*in
Bharat Bhushan
Themen in »Scanning Probe Microscopy in Nanoscience and Nanotechnology«
Industrie Nanomaterial Sensor atomic force microscope biomimetics biosensor carbon nanotubes electronics mechanics modeling nanoscience nanostructure nanotechnology soft matter surface