New Horizons of Applied Scanning Electron Microscopy
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Beschreibung
In modern scanning electron microscopy, sample surface preparation is of key importance, just as it is in transmission electron microscopy. With the procedures for sample surface preparation provided in the present book, the enormous potential of advanced scanning electron microscopes can be realized fully. This will take the reader to an entirely new level of scanning electron microscopy and finely-detailed images never seen before.
In modern scanning electron microscopy, sample surface preparation is of key importance, just as it is in transmission electron microscopy. With the procedures for sample surface preparation provided in the present book, the enormous potential of advanced scanning electron microscopes can be realized fully. This will take the reader to an entirely new level of scanning electron microscopy and finely-detailed images never seen before.
Presents a new technique to significantly improve in resolution and extent the applicational field of scanning electron microscopy Covers physics, sample preparation and technical aspects Offers many insights and hints based on the authors' excellent experimental experience Includes supplementary material: sn.pub/extras
Autor*in
Kenichi Shimizu
Themen in »New Horizons of Applied Scanning Electron Microscopy«
High-resolution SEM Metals and their structures SEM sample preparation Sample surface preparation Scanning electron microscopy alloy electron microscopy microscopy scanning electron microscope transmission electron microscopy
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From the reviews:
“The book is attractively presented, in hardcover with numerous illustrations. It is a text book doing little to disguise its academic spirit discussing its subject through a series of chapters covering the technical capabilities of FE-SEM within the materials science field. … In conclusion, a well written book of interest to experienced material scientists. The book is a relevant resource for those in academic institutions and industry segments where high resolution scanning electron microscopy is employed.” (Roland A. Fleck, Infocus Magazine, Issue 21, March, 2011)()