Scanning Tunneling Microscopy and its Application
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Beschreibung
Scanning Tunneling Microscopy and its Application presents a unified view of the rapidly growing field of STM, and its many derivatives. A thorough discussion of the various principles provides the background of the tunneling phenomena and leads to the many novel scanning-probe techniques, such as AFM, MFM, BEEM, PSTM, etc. After having examined the available instrumentation and the methods for tip and surface preparations, the monograph provides detailed accounts of STM application to metal and semiconductor surface, adsorbates and surface chemistry, biology, and nonofabrication. It examines limitations of the present-day investigations, and provides hints toward further trends.
Scanning Tunneling Microscopy and its Application touches on the principles of STM and other related techniques, and their practical applications. It presents detailed STM instrumentation and the applications in metal and semiconductor surfaces, surface adsorbates and nano-fabrication. This title is particularly of practical use to the readers, as such detailed information is not available in published research papers. Besides a large amount of useful figures, it uses simple language to discuss problems in depth in order to let the readers understand and master basic conceptions of the subject. Deliberately designed as an ABC book for beginners, it provides enough information for professionals for an integrated understanding of STM and other related techniques.
Autor*in
Chunli Bai