High-Resolution Imaging and Spectrometry of Materials
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Beschreibung
This book gives a survey of and systematic introduction to high-resolution electron microscopy. The method is carefully discussed, the latest developments are reported, and the application to surface and interface analysis and to the study of hidden structures is presented. The book arises from research carried out at one of the world's leading centers of electron microscopy. It will appeal to researchers and advanced students.
This book is an advanced text on high-resolution electron microscopy. It gives a survey of high-level electron microscopy and its application to surface and interface studies.
In contrast to previously available books this not only reports on the state of the art of advanced electron microscopy but also contains examples of applications Includes supplementary material: sn.pub/extras
Autor*in
Frank Ernst
Themen in »High-Resolution Imaging and Spectrometry of Materials«
AFM STM Transmission advanced electron optics coherent electron techniques composite electron microscopy electron optics imaging microscopy optics scanning probe techniques spectroscopy surface analysis transmission electron microscopy