Scanning Electron Microscopy

Beschreibung

Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interations. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
Main benefit is information about the physics of image formation and microanalysis in scanning electron microscopy 2nd, completely revised and updated edition

Autor*in

P.W. Hawkes

Themen in »Scanning Electron Microscopy«

Rasterelektronen Mikroskopie Scanning Tunneling Microscopy crystal diffraction electron microscope electron microscopy electron optics microscopy optics scanning electron microscope

Stimmen zu »Scanning Electron Microscopy«

"...this book is both linguistically and scientifically outstanding. It is an inspiring book for beginners and experienced SEM operators alike. The list of references is especially useful. This volume makes an outstanding contribution to the deeper understanding of the SEM."

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