Structural, Syntactic, and Statistical Pattern Recognition
Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006, Proceedings
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Beschreibung
Autor*in
Dit-Yan Yeung
Themen in »Structural, Syntactic, and Statistical Pattern Recognition«
Bayesian network Monte Carlo Method bayesian networks biometrics clustering document analysis feature extraction graphical pattern recognition image analysis modeling object recognition pattern recognition robot statistic statistics
Stimmen zu »Structural, Syntactic, and Statistical Pattern Recognition«
Details
ISBN: 9783540372363
Verlag: Springer Berlin
Erscheinung: 03.08.2006