Surface and Thin Film Analysis
A Compendium of Principles, Instrumentation, and Applications
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Beschreibung
Surveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. This new book has been revised and updated and is divided into four parts - electron, ion, and photon detection, as well as scanning probe microscopy. New chapters have been added to cover such techniques as SNOM, FIM, atom probe (AP),and sum frequency generation (SFG). Appendices with a summary and comparison of techniques and a list of equipment suppliers make this book a rapid reference for materials scientists, analytical chemists, and those working in the biotechnological industry.
From a Review of the First Edition (edited by Bubert and Jenett)
"... a useful resource..."
(Journal of the American Chemical Society)
Autor*in
Gernot Friedbacher
Themen in »Surface and Thin Film Analysis«
Analytical Chemistry Analytische Chemie Chemie Chemie / Theoretische Chemie Chemische Analyse Chemistry Dünne Schicht Dünne Schichten, Oberflächen u. Grenzflächen Materials Characterization Materials Science Materialwissenschaften Oberfläche Spectroscopy Spektroskopie Thin Films, Surfaces & Interfaces
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"...a useful resource..." Journal of the American Chemical Society
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