Advances in Speckle Metrology and Related Techniques
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Beschreibung
Speckle metrology includes various optical techniques that are based on the speckle fields generated by reflection from a rough surface or by transmission through a rough diffuser. These techniques have proven to be very useful in testing different materials in a non-destructive way. They have changed dramatically during the last years due to the development of modern optical components, with faster and more powerful digital computers, and novel data processing approaches.
This most up-to-date overview of the topic describes new techniques developed in the field of speckle metrology over the last decade, as well as applications to experimental mechanics, material science, optical testing, and fringe analysis.
Autor*in
Guillermo H. Kaufmann
Themen in »Advances in Speckle Metrology and Related Techniques«
Bildgebende Systeme u. Verfahren Electrical & Electronics Engineering Elektrotechnik u. Elektronik Imaging Systems & Technology Materials Science Materialwissenschaften Optical and Non-Linear Optical Materials Optics & Photonics Optik u. Photonik Optische u. Nichtlineare Optische Materialien Photonics & Lasers Photonik Photonik u. Laser Physics Physik