Lock-in Thermography
Basics and Use for Evaluating Electronic Devices and Materials
Buch in deiner Nähe kaufen
Beschreibung
This book discusses lock-in thermography (LIT) as a dynamic variant of the widely known IR thermography. It focuses on applications to electronic devices and materials, but also includes chapters addressing non-destructive evaluation. Periodically modulating heat sources allows a much-improved signal-to-noise ratio (up to 1000x) and a far better lateral resolution compared to steady-state thermography. Reviewing various experimental approaches to LIT, particularly the commercial LIT systems available, this 3rd edition introduces new LIT applications, such as illuminated LIT applied to solar cells, non-thermal LIT lifetime mapping and LIT application to spin caloritronics problems. Numerous LIT investigation case studies are also included.
Describes an imaging technique for the evaluation of materials and electronic devices Discusses various new application fields of lock-in thermography Is useful as a reference work for researchers and engineers alike Includes extensive comparison to Photoluminescence Imaging
Autor*in
Otwin Breitenstein
Themen in »Lock-in Thermography«
Solar Cell Characterization Shunt Imaging IC Failure Analysis Electronic Device Failure Analysis Trap Density Mapping Non-thermal LIT lifetime mapping LIT application to spin caloritronics problems Illuminated LIT applied to solar cells Power devices for electric cars