This book focuses on the widely used experimental techniques available for the structural, morphological, and spectroscopic characterization of materials. Recent developments in a wide range of experimental techniques and their application to the quantification of materials properties are an essential side of this book. Moreover, it provides concise but thorough coverage of the practical and theoretical aspects of the analytical techniques used to characterize a wide variety of functional nanomaterials. The book provides an overview of widely used characterization techniques for a broad audience: from beginners and graduate students, to advanced specialists in both academia and industry.
Provides comprehensive information on the structural, morphological and spectroscopic characterization of materials
Addresses theoretical and experimental aspects alike, with special emphasis on sample preparation and experimental setup
Includes sections devoted to instrumentation and data interpretation for each technique covered
Surender Kumar Sharma
X-ray Diffraction (XRD) methods Electron Microscopy Scanning Force Microscopy Dynamic Light Scattering Optical Absorption Spectroscopy Photoluminescence and electronic Spectroscopy X-ray Absorption Spectroscopy Mössbauer Spectroscopy Dielectric and Impedance Spectroscopy