Charge-Trapping Non-Volatile Memories
Volume 2--Emerging Materials and Structures
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Beschreibung
This book describes the technology of charge-trapping non-volatile memories and their uses. The authors explain the device physics of each device architecture and provide a concrete description of the materials involved and the fundamental properties of the technology. Modern material properties, used as charge-trapping layers, for new applications are introduced.
- Provides a comprehensive overview of the technology for charge-trapping non-volatile memories;
- Details new architectures and current modeling concepts for non-volatile memory devices;
- Focuses on conduction through multi-layer gatedielectrics stacks.
This book describes the technology of charge-trapping non-volatile memories and their uses. The authors explain the device physics of each device architecture and provide a concrete description of the materials involved and the fundamental properties of the technology. Modern material properties, used as charge-trapping layers, for new applications are introduced.Provides a comprehensive overview of the technology for charge-trapping non-volatile memories;Details new architectures and current modeling concepts for non-volatile memory devices;Focuses on conduction through multi-layer gate dielectrics stacks.
Provides a comprehensive overview of the technology for charge-trapping non-volatile memories Details new architectures and current modeling concepts for non-volatile memory devices Focuses on conduction through multi-layer gate dielectrics stacks Includes supplementary material: sn.pub/extras
Autor*in
Panagiotis Dimitrakis
Themen in »Charge-Trapping Non-Volatile Memories«
3D Non-volatile Memories Charge-trapping Layer Charge-trapping Memories Flash Memories MAHOS MANOS MONOS Nitride Memories Non-volatile Memories SONOS Semiconductor Memories TANOS