Shin VLSI-SoC: Design for Reliability, Security, and Low Power

VLSI-SoC: Design for Reliability, Security, and Low Power

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23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers

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Beschreibung

This book contains extended and revised versions of the best papers presented at the 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, held in Daejeon, Korea, in October 2015. The 10 papers included in the book were carefully reviewed and selected from the 44 full papers presented at the conference. The papers cover a wide range of topics in VLSI technology and advanced research. They address the current trend toward increasing chip integration and technology process advancements bringing about new challenges both at the physical and system-design levels, as well as in the test of these systems.
Includes supplementary material: sn.pub/extras

Autor*in

Youngsoo Shin

Themen in »VLSI-SoC: Design for Reliability, Security, and Low Power«

chip integration computer architecture computer-aided design (CAD) field-programmable gate array (FPGA) hardware logic design low power microprocessor chips security sensors signal processing system on chip (SoC) systems design Very Large Scale Integration VLSI circuits

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Details

ISBN: 9783319834405
Verlag: Springer International Publishing
Erscheinung: 22.04.2018

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