Jeffrey Prinzie Michiel Steyaert Paul Leroux Prinzie Radiation Hardened CMOS Integrated Circuits for Time-Based Signal Processing

Radiation Hardened CMOS Integrated Circuits for Time-Based Signal Processing

von Jeffrey Prinzie Michiel Steyaert Paul Leroux

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Beschreibung

This book presents state-of-the-art techniques for radiation hardened high-resolution Time-to-Digital converters and low noise frequency synthesizers. Throughout the book, advanced degradation mechanisms and error sources are discussed and several ways to prevent such errors are presented. An overview of the prerequisite physics of nuclear interactions is given that has been compiled in an easy to understand chapter. The book is structured in a way that different hardening techniques and solutions are supported by theory and experimental data with their various tradeoffs.


This book presents state-of-the-art techniques for radiation hardened high-resolution Time-to-Digital converters and low noise frequency synthesizers. Throughout the book, advanced degradation mechanisms and error sources are discussed and several ways to prevent such errors are presented. An overview of the prerequisite physics of nuclear interactions is given that has been compiled in an easy to understand chapter. The book is structured in a way that different hardening techniques and solutions are supported by theory and experimental data with their various tradeoffs.


Based on leading-edge research, conducted in collaboration between KU Leuven and CERN, the European Center for Nuclear Research Describes in detail advanced techniques to harden circuits against ionizing radiation Provides a practical way to learn and understand radiation effects in time-based circuits Includes an introduction to the underlying physics, circuit design, and advanced techniques accompanied with experimental data

Autor*in

Jeffrey Prinzie

Themen in »Radiation Hardened CMOS Integrated Circuits for Time-Based Signal Processing«

Radiation-Tolerant Circuits Radiation-hardened circuits Soft errors Fault-tolerant design Radiation Effects in CMOS

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Details

ISBN: 9783319786155
Verlag: Springer International Publishing
Erscheinung: 07.05.2018

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