Spectroscopic Ellipsometry for Photovoltaics
Volume 1: Fundamental Principles and Solar Cell Characterization
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Beschreibung
This book provides a basic understanding of spectroscopic ellipsometry, with a focus on characterization methods of a broad range of solar cell materials/devices, from traditional solar cell materials (Si, CuInGaSe2, and CdTe) to more advanced emerging materials (Cu2ZnSnSe4, organics, and hybrid perovskites), fulfilling a critical need in the photovoltaic community.
The book describes optical constants of a variety of semiconductor light absorbers, transparent conductive oxides and metals that are vital for the interpretation of solar cell characteristics and device simulations. It is divided into four parts: fundamental principles of ellipsometry; characterization of solar cell materials/structures; ellipsometry applications including optical simulations of solar cell devices and online monitoring of film processing; and the optical constants of solar cell component layers.
Presents ellipsometry characterization of solar cell materials/devices
Provides easy-to-understand explanations of ellipsometry data analysis
Includes optical constants for all solar-cell component layers
Presents ellipsometry characterization of solar cell materials/devices Provides easy-to-understand explanations of ellipsometry data analysis Includes optical constants for all solar-cell component layers
Autor*in
Hiroyuki Fujiwara
Themen in »Spectroscopic Ellipsometry for Photovoltaics«
Amorphous Si solar cells CIGS growth ananlysis Compound solar cells Hybrid perovskites Microcrystalline Si solar cells Nanomaterial-based solar cells Optical analysis of solar cells Optical constants of solar materials Organic solar cells Si heterojunction solar cells Spectroscopic ellipsometry