Phase Change Memory
Device Physics, Reliability and Applications
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Beschreibung
This book describes the physics of phase change memory devices, starting from basic operation to reliability issues. The book gives a comprehensive overlook of PCM with particular attention to the electrical transport and the phase transition physics between the two states. The book also contains design engineering details on PCM cell architecture, PCM cell arrays (including electrical circuit management), as well as the full spectrum of possible future applications.
Includes a complete overview of the phase change memory technology and physics of its operation
Details thermal models alongside crystallization kinetics models
Covers key reliability features with an in-depth discussion of physical mechanisms that are currently limiting PCM capabilities
Offers an overview of device architectures, array management and future applications
Includes a complete overview of the phase change memory technology and physics of its operation Details thermal models alongside crystallization kinetics models Covers key reliability features with an in-depth discussion of physical mechanisms that are currently limiting PCM capabilities Offers an overview of device architectures, array management and future applications
Autor*in
Andrea Redaelli
Themen in »Phase Change Memory«
Non volatile memory chalcogenide glasses semiconductor chip PCM device physics PCM array management