R.F. Egerton Egerton Physical Principles of Electron Microscopy

Physical Principles of Electron Microscopy

von R.F. Egerton

An Introduction to TEM, SEM, and AEM

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Beschreibung

This popular textbook provides an introduction to the theory and practice of electron microscopy. The second edition has been updated to reflect the recent developments, including correction of lens aberrations in a TEM column and new material on environmental TEM and SEM. The text is linked to a new website that contains additional educational material such as sample exam questions and answers to selected problems. This edition also contains expanded reference lists that allow the reader to efficiently explore key topics in greater depth.
Scanning and fixed-beam electron microscopes are an indispensable tool for both research and routine evaluation in the physical, biological and medical sciences, including specialized fields in materials science, nanotechnology and semiconductor processing. Physical Principles of Electron Microscopy, Second Edition, is ideal for students, researchers, and technologists who make use of electron microscopes but haveonly a limited knowledge of physics and mathematics. Undergraduate students will understand how basic principles of physics are utilized in this important area of applied science, while university teachers and researchers will find a concise but authoritative teaching, supplemental, or reference text covering the basic principles and practice of microscopy.



Thoroughly revised and updated from the popular 2005 edition, this textbook introduces both the theory and current practice of electron microscopy Contains expanded reference lists as a launch point into the specialist literature Requires only a first-year undergraduate knowledge of physics Written by a leading author who received the 2004 Distinguished Physical Scientist Award of the Microscopical Society of America Covers principles and techniques essential to materials science, the semiconductor industry, nanotechnology, and the biomedical and forensic sciences Includes supplementary material: sn.pub/extras

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R.F. Egerton

Themen in »Physical Principles of Electron Microscopy«

Electron Microscopy Textbook X-ray Emission Spectroscopy Electron Microscope Analytical Electron Microscopy Optical Microscope Scanning Electron Microscope Scanning Transmission Electron Microscope Transmission Electron Microscopy Biological Microscopy

Stimmen zu »Physical Principles of Electron Microscopy«

Details

ISBN: 9783319398778
Verlag: Springer International Publishing
Erscheinung: 01.07.2016

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