Analog and Mixed Signal Test
A Recent History
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Beschreibung
This book serves as a “go-to” guide to the most important research in the last 20 years in analog and mixed-signal test. Topics covered include: analog Built-in Self-test, analog design-for-test, IEEE standards based test for analog and mixed-signal circuits, RF test, Data Converter (DAC/ADC) testing, automatic test equipment, alternate test, machine learning and big data solutions for analog/mixed-signal systems-on-chip. The author has designed the presentation so that readers can get up to speed quickly in the various cutting-edge topics in mixed signal research, or use the information as a guide for diving more deeply into the most relevant literature, without losing time.
This book serves as a “go-to” guide to the most important research in the last 20 years in analog and mixed-signal test. Topics covered include: analog Built-in Self-test, analog design-for-test, IEEE standards based test for analog and mixed-signal circuits, RF test, Data Converter (DAC/ADC) testing, automatic test equipment, alternate test, machine learning and big data solutions for analog/mixed-signal systems-on-chip. The author has designed the presentation so that readers can get up to speed quickly in the various cutting-edge topics in mixed signal research, or use the information as a guide for diving more deeply into the most relevant literature, without losing time.
Surveys important advances in the past 20 years in the areas of analog and mixed-signal test to give readers a jumpstart on specific sub-topics
Covers leading-edge topics, such as Analog BIST, System-on-chip testing, DAC/ADC Testing, Machine learning in mixed-signal test
Links to companion website and blog tracking latest developments in analog and mixed-signal test
Autor*in
Suraj Sindia
Themen in »Analog and Mixed Signal Test«
AMS-IC Analog BIST Analog and mixed-signal test DAC/ADC Testing Design-for-test for AMS-IC Machine Learning in Mixed-signal Test System-on-chip testing VLSI Testing