Charge-Trapping Non-Volatile Memories
Volume 1 – Basic and Advanced Devices
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Beschreibung
This book describes the basic technologies and operation principles of charge-trapping non-volatile memories. The authors explain the device physics of each device architecture and provide a concrete description of the materials involved as well as the fundamental properties of the technology. Modern material properties used as charge-trapping layers, for new applications are introduced.
This book describes the basic technologies and operation principles of charge-trapping non-volatile memories. The authors explain the device physics of each device architecture and provide a concrete description of the materials involved as well as the fundamental properties of the technology. Modern material properties used as charge-trapping layers, for new applications are introduced.
Provides a comprehensive overview of the technology for charge-trapping non-volatile memories Details new architectures and current modeling concepts for non-volatile memory devices Focuses on conduction through multi-layer gate dielectrics stacks
Autor*in
Panagiotis Dimitrakis
Themen in »Charge-Trapping Non-Volatile Memories«
3D Non-volatile Memories Charge-trapping Layer Charge-trapping Memories Flash Memories MAHOS MANOS MONOS Nitride Memories Non-volatile Memories SONOS Semiconductor Memories TANOS