Henning Döscher Döscher GaP Heteroepitaxy on Si(100)

GaP Heteroepitaxy on Si(100)

von Henning Döscher

Benchmarking Surface Signals when Growing GaP on Si in CVD Ambients

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Beschreibung

Epitaxial integration of III-V semiconductors on silicon substrates has been desired over decades for high application potential in microelectronics, photovoltaics, and beyond. The performance of optoelectronic devices is still severely impaired by critical defect mechanisms driven by the crucial polar-on-nonpolar heterointerface. This thesis reports almost lattice-matched growth of thin gallium phosphide films as a viable model system for III-V/Si(100) interface investigations. The impact of antiphase disorder on the heteroepitaxial growth surface provides quantitative optical in situ access to one of the most notorious defect mechanisms, even in the vapor phase ambient common for compound semiconductor technology. Precise control over the surface structure of the Si(100) substrates prior to III-V nucleation prevents the formation of antiphase domains. The hydrogen-based process ambient enables the preparation of anomalous double-layer step structures on Si(100), highly beneficial for subsequent III-V integration.
Epitaxial integration of III-V semiconductors on silicon substrates has been desired over decades for high application potential in microelectronics, photovoltaics, and beyond. The performance of optoelectronic devices is still severely impaired by critical defect mechanisms driven by the crucial polar-on-nonpolar heterointerface. This thesis reports almost lattice-matched growth of thin gallium phosphide films as a viable model system for III-V/Si(100) interface investigations. The impact of antiphase disorder on the heteroepitaxial growth surface provides quantitative optical in situ access to one of the most notorious defect mechanisms, even in the vapor phase ambient common for compound semiconductor technology. Precise control over the surface structure of the Si(100) substrates prior to III-V nucleation prevents the formation of antiphase domains. The hydrogen-based process ambient enables the preparation of anomalous double-layer step structures on Si(100), highly beneficial for subsequent III-V integration.
Winner of a 2012 German Physical Society Dissertation Award An important contribution to improving optoelectronic devices and performance of photovoltaic materials Interesting for all experimentalists working on the integration of III-V semiconductors and silicon

Autor*in

Henning Döscher

Themen in »GaP Heteroepitaxy on Si(100)«

Anti-phase Disorder III-V Semiconductor Heteroepitaxy on Silicon Substrates In Situ Reflectance Anisotropy Spectroscopy Lattice-matched Growth Materials for Photovoltaics Metal-organic Vapor Phase Epitaxy Polar on Non-polar Interface

Stimmen zu »GaP Heteroepitaxy on Si(100)«

Details

ISBN: 9783319028798
Verlag: Springer International Publishing
Erscheinung: 11.12.2013

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