Rietveld Refinement in the Characterization of Crystalline Materials

Beschreibung

This Special Issue serves as a crystallographic forum covering various aspects of material science that have in common the use of the powerful Rietveld method in the analysis of the powder XRD patterns of investigated compounds.

Autor*in

Igor Djerdj
Josip Juraj Strossmayer University of Osijek, Department of Chemistry, Osijek, Croatia

Themen in »Rietveld Refinement in the Characterization of Crystalline Materials«

Crystalline materials Functional materials Microstructural analysis Rietveld method Structural characterization Structural materials X-ray and neutron diffraction

Stimmen zu »Rietveld Refinement in the Characterization of Crystalline Materials«

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